Events

ITC

Amkor Technology will participate in the International Test Conference (ITC), the world’s premier conference focused on the testing of electronic devices, boards, and systems throughout the product lifecycle. The event will take place on October 11–16, 2026 at the Grand Hyatt River Walk in San Antonio, TX. ITC brings together test and design professionals from industry, academia, and the supplier community to address current challenges and advancements in semiconductor testing and reliability.

As part of the conference program, Omer Dossani, Vice President, Global Test Services, will present “Advanced Packages, AI & Amkor: The OSAT Test Perspective.” Attendees will gain insight into the OSAT perspective on the AI and HPC ecosystem, including increasing production test times, the challenges associated with multi-chiplet advanced packages, thermal-mechanical performance considerations, wafer- and package-level test access constraints, and the need for design-for-test enhancements to simplify production workflows and help reduce overall costs.

Through collaboration with customers, partners, academia, and industry experts, Amkor continues to advance innovation in semiconductor packaging and test technologies, contribute to discussions shaping the future of testing and reliability, and strengthen the semiconductor ecosystem while advancing what’s next.