NIST Semiconductor Metrology R&D Workshop
Join Amkor Technology for the NIST Semiconductor Metrology R&D Workshop on April 20 – 21, 2022 from 10:00 AM – 2:00 PM EST. This webinar will cover the microelectronics innovation ecosystem and identify the optimal approaches in measurement science, standards development, and measurement services to support the U.S. industry.
Gerard John, Sr. Director, FCBGA BU at Amkor will be a panelist during the session: “Novel Metrologies for Advanced Packaging ” on April 20 from 1:00 – 2:00 PM EST. There will be a Q&A following the session.
Panel moderator: Jan Vardaman, TechSearch International
Additional panelists include:
- Deepak Kulkarni, AMD
- Raj Kumar, TTM Technologies
- Dale McHerron, IBM Research